[V2] tests/external_memory:VFIO module parameter increase the allowed limit
Commit Message
According to commit 016763c21958 ("vfio: do not merge contiguous areas").
VFIO module parameter ``dma_entry_limit`` with a default value of 64K.
When application is out of DMA entries, these limits need to be adjusted to increase the allowed limit .
Signed-off-by: Chen Lingli <linglix.chen@intel.com>
---
V2:modifie comment use git commit description style
V1:modifie dts
tests/TestSuite_external_memory.py | 1 +
1 file changed, 1 insertion(+)
Comments
> -----Original Message-----
> From: Chen, LingliX
> Sent: Saturday, March 13, 2021 1:37 AM
> To: dts@dpdk.org
> Cc: Chen, LingliX <linglix.chen@intel.com>
> Subject: [dts][PATCH V2] tests/external_memory:VFIO module parameter
> increase the allowed limit
Tested-by: Chen Lingli <linglix.chen@intel.com>
> According to commit 016763c21958 ("vfio: do not merge contiguous areas").
> VFIO module parameter ``dma_entry_limit`` with a default value of 64K.
> When application is out of DMA entries, these limits need to be adjusted to
> increase the allowed limit .
>
> Signed-off-by: Chen Lingli <linglix.chen@intel.com>
> ---
> V2:modifie comment use git commit description style V1:modifie dts
Applied, thanks
@@ -111,6 +111,7 @@ class TestExternalMemory(TestCase):
Verifier VFIO_PCI and anonymous memory allocation
"""
self.insmod_modprobe(modename="vfio-pci")
+ self.dut.send_expect("echo 655359 > /sys/module/vfio_iommu_type1/parameters/dma_entry_limit", "#", 10)
self.eal_para = self.dut.create_eal_parameters(cores="1S/4C/1T")
self.dut.send_expect(r'./%s %s -- --mp-alloc=xmem -i'