diff mbox series

[V1] tests/external_memory:VFIO module parameter increase the allowed limit

Message ID 20210312171202.3695-1-linglix.chen@intel.com (mailing list archive)
State Superseded
Headers
Series [V1] tests/external_memory:VFIO module parameter increase the allowed limit |

Commit Message

Lingli Chen March 12, 2021, 5:12 p.m. UTC 
  According to DPDK commit 016763c219580292c8b05059c7452a7a11d0d19e
VFIO module parameter ``dma_entry_limit`` with a default value of 64K.
When application is out of DMA entries, these limits need to be adjusted to
increase the allowed limit .

Signed-off-by: Chen Lingli <linglix.chen@intel.com>
---
 tests/TestSuite_external_memory.py | 1 +
 1 file changed, 1 insertion(+)
diff mbox series

Patch

diff --git a/tests/TestSuite_external_memory.py b/tests/TestSuite_external_memory.py
index 0224a319..e31b2787 100644
--- a/tests/TestSuite_external_memory.py
+++ b/tests/TestSuite_external_memory.py
@@ -111,6 +111,7 @@  class TestExternalMemory(TestCase):
         Verifier VFIO_PCI and anonymous memory allocation
         """
         self.insmod_modprobe(modename="vfio-pci")
+        self.dut.send_expect("echo 655359 > /sys/module/vfio_iommu_type1/parameters/dma_entry_limit", "#", 10)
 
         self.eal_para = self.dut.create_eal_parameters(cores="1S/4C/1T")
         self.dut.send_expect(r'./%s %s -- --mp-alloc=xmem -i'