diff mbox series

[2/5] eal: add unit tests for bit operations

Message ID 20240809090439.589295-3-mattias.ronnblom@ericsson.com (mailing list archive)
State Superseded
Delegated to: Thomas Monjalon
Headers
Series Improve EAL bit operations API |

Checks

Context Check Description
ci/checkpatch warning coding style issues

Commit Message

Mattias Rönnblom Aug. 9, 2024, 9:04 a.m. UTC 
Extend bitops tests to cover the
rte_bit_[test|set|clear|assign|flip]()
functions.

The tests are converted to use the test suite runner framework.

RFC v6:
 * Test rte_bit_*test() usage through const pointers.

RFC v4:
 * Remove redundant line continuations.

Signed-off-by: Mattias Rönnblom <mattias.ronnblom@ericsson.com>
Acked-by: Morten Brørup <mb@smartsharesystems.com>
Acked-by: Tyler Retzlaff <roretzla@linux.microsoft.com>
---
 app/test/test_bitops.c | 85 ++++++++++++++++++++++++++++++++++--------
 1 file changed, 70 insertions(+), 15 deletions(-)

Comments

Stephen Hemminger Aug. 9, 2024, 3:03 p.m. UTC | #1 
On Fri, 9 Aug 2024 11:04:36 +0200
Mattias Rönnblom <mattias.ronnblom@ericsson.com> wrote:

> -uint32_t val32;
> -uint64_t val64;
> +#define GEN_TEST_BIT_ACCESS(test_name, set_fun, clear_fun, assign_fun,	\
> +			    flip_fun, test_fun, size)			\
> +	static int							\
> +	test_name(void)							\
> +	{								\
> +		uint ## size ## _t reference = (uint ## size ## _t)rte_rand(); \
> +		unsigned int bit_nr;					\
> +		uint ## size ## _t word = (uint ## size ## _t)rte_rand(); \
> +									\
> +		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
> +			bool reference_bit = (reference >> bit_nr) & 1;	\
> +			bool assign = rte_rand() & 1;			\
> +			if (assign)					\
> +				assign_fun(&word, bit_nr, reference_bit); \
> +			else {						\
> +				if (reference_bit)			\
> +					set_fun(&word, bit_nr);		\
> +				else					\
> +					clear_fun(&word, bit_nr);	\
> +									\
> +			}						\
> +			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
> +				    "Bit %d had unexpected value", bit_nr); \
> +			flip_fun(&word, bit_nr);			\
> +			TEST_ASSERT(test_fun(&word, bit_nr) != reference_bit, \
> +				    "Bit %d had unflipped value", bit_nr); \
> +			flip_fun(&word, bit_nr);			\
> +									\
> +			const uint ## size ## _t *const_ptr = &word;	\
> +			TEST_ASSERT(test_fun(const_ptr, bit_nr) ==	\
> +				    reference_bit,			\
> +				    "Bit %d had unexpected value", bit_nr); \
> +		}							\
> +									\
> +		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
> +			bool reference_bit = (reference >> bit_nr) & 1;	\
> +			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
> +				    "Bit %d had unexpected value", bit_nr); \
> +		}							\
> +									\
> +		TEST_ASSERT(reference == word, "Word had unexpected value"); \
> +									\
> +		return TEST_SUCCESS;					\
> +	}
> +
> +GEN_TEST_BIT_ACCESS(test_bit_access32, rte_bit_set, rte_bit_clear,
> +		    rte_bit_assign, rte_bit_flip, rte_bit_test, 32)
> +
> +GEN_TEST_BIT_ACCESS(test_bit_access64, rte_bit_set, rte_bit_clear,
> +		    rte_bit_assign, rte_bit_flip, rte_bit_test, 64)

Having large macro like this for two cases adds complexity without
additional clarity. Just duplicate the code please.
Mattias Rönnblom Aug. 9, 2024, 3:37 p.m. UTC | #2 
On 2024-08-09 17:03, Stephen Hemminger wrote:
> On Fri, 9 Aug 2024 11:04:36 +0200
> Mattias Rönnblom <mattias.ronnblom@ericsson.com> wrote:
> 
>> -uint32_t val32;
>> -uint64_t val64;
>> +#define GEN_TEST_BIT_ACCESS(test_name, set_fun, clear_fun, assign_fun,	\
>> +			    flip_fun, test_fun, size)			\
>> +	static int							\
>> +	test_name(void)							\
>> +	{								\
>> +		uint ## size ## _t reference = (uint ## size ## _t)rte_rand(); \
>> +		unsigned int bit_nr;					\
>> +		uint ## size ## _t word = (uint ## size ## _t)rte_rand(); \
>> +									\
>> +		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
>> +			bool reference_bit = (reference >> bit_nr) & 1;	\
>> +			bool assign = rte_rand() & 1;			\
>> +			if (assign)					\
>> +				assign_fun(&word, bit_nr, reference_bit); \
>> +			else {						\
>> +				if (reference_bit)			\
>> +					set_fun(&word, bit_nr);		\
>> +				else					\
>> +					clear_fun(&word, bit_nr);	\
>> +									\
>> +			}						\
>> +			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
>> +				    "Bit %d had unexpected value", bit_nr); \
>> +			flip_fun(&word, bit_nr);			\
>> +			TEST_ASSERT(test_fun(&word, bit_nr) != reference_bit, \
>> +				    "Bit %d had unflipped value", bit_nr); \
>> +			flip_fun(&word, bit_nr);			\
>> +									\
>> +			const uint ## size ## _t *const_ptr = &word;	\
>> +			TEST_ASSERT(test_fun(const_ptr, bit_nr) ==	\
>> +				    reference_bit,			\
>> +				    "Bit %d had unexpected value", bit_nr); \
>> +		}							\
>> +									\
>> +		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
>> +			bool reference_bit = (reference >> bit_nr) & 1;	\
>> +			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
>> +				    "Bit %d had unexpected value", bit_nr); \
>> +		}							\
>> +									\
>> +		TEST_ASSERT(reference == word, "Word had unexpected value"); \
>> +									\
>> +		return TEST_SUCCESS;					\
>> +	}
>> +
>> +GEN_TEST_BIT_ACCESS(test_bit_access32, rte_bit_set, rte_bit_clear,
>> +		    rte_bit_assign, rte_bit_flip, rte_bit_test, 32)
>> +
>> +GEN_TEST_BIT_ACCESS(test_bit_access64, rte_bit_set, rte_bit_clear,
>> +		    rte_bit_assign, rte_bit_flip, rte_bit_test, 64)
> 
> Having large macro like this for two cases adds complexity without
> additional clarity. Just duplicate the code please.

GEN_TEST_BIT_ACCESS is being used by six more test cases in later 
patches in the series.
Stephen Hemminger Aug. 9, 2024, 4:31 p.m. UTC | #3 
On Fri, 9 Aug 2024 17:37:08 +0200
Mattias Rönnblom <hofors@lysator.liu.se> wrote:

> On 2024-08-09 17:03, Stephen Hemminger wrote:
> > On Fri, 9 Aug 2024 11:04:36 +0200
> > Mattias Rönnblom <mattias.ronnblom@ericsson.com> wrote:
> >   
> >> -uint32_t val32;
> >> -uint64_t val64;
> >> +#define GEN_TEST_BIT_ACCESS(test_name, set_fun, clear_fun, assign_fun,	\
> >> +			    flip_fun, test_fun, size)			\
> >> +	static int							\
> >> +	test_name(void)							\
> >> +	{								\
> >> +		uint ## size ## _t reference = (uint ## size ## _t)rte_rand(); \
> >> +		unsigned int bit_nr;					\
> >> +		uint ## size ## _t word = (uint ## size ## _t)rte_rand(); \
> >> +									\
> >> +		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
> >> +			bool reference_bit = (reference >> bit_nr) & 1;	\
> >> +			bool assign = rte_rand() & 1;			\
> >> +			if (assign)					\
> >> +				assign_fun(&word, bit_nr, reference_bit); \
> >> +			else {						\
> >> +				if (reference_bit)			\
> >> +					set_fun(&word, bit_nr);		\
> >> +				else					\
> >> +					clear_fun(&word, bit_nr);	\
> >> +									\
> >> +			}						\
> >> +			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
> >> +				    "Bit %d had unexpected value", bit_nr); \
> >> +			flip_fun(&word, bit_nr);			\
> >> +			TEST_ASSERT(test_fun(&word, bit_nr) != reference_bit, \
> >> +				    "Bit %d had unflipped value", bit_nr); \
> >> +			flip_fun(&word, bit_nr);			\
> >> +									\
> >> +			const uint ## size ## _t *const_ptr = &word;	\
> >> +			TEST_ASSERT(test_fun(const_ptr, bit_nr) ==	\
> >> +				    reference_bit,			\
> >> +				    "Bit %d had unexpected value", bit_nr); \
> >> +		}							\
> >> +									\
> >> +		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
> >> +			bool reference_bit = (reference >> bit_nr) & 1;	\
> >> +			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
> >> +				    "Bit %d had unexpected value", bit_nr); \
> >> +		}							\
> >> +									\
> >> +		TEST_ASSERT(reference == word, "Word had unexpected value"); \
> >> +									\
> >> +		return TEST_SUCCESS;					\
> >> +	}
> >> +
> >> +GEN_TEST_BIT_ACCESS(test_bit_access32, rte_bit_set, rte_bit_clear,
> >> +		    rte_bit_assign, rte_bit_flip, rte_bit_test, 32)
> >> +
> >> +GEN_TEST_BIT_ACCESS(test_bit_access64, rte_bit_set, rte_bit_clear,
> >> +		    rte_bit_assign, rte_bit_flip, rte_bit_test, 64)  
> > 
> > Having large macro like this for two cases adds complexity without
> > additional clarity. Just duplicate the code please.  
> 
> GEN_TEST_BIT_ACCESS is being used by six more test cases in later 
> patches in the series.

Would it be possible to make it a function and pass function pointers with
Generic?
Mattias Rönnblom Aug. 9, 2024, 4:57 p.m. UTC | #4 
On 2024-08-09 18:31, Stephen Hemminger wrote:
> On Fri, 9 Aug 2024 17:37:08 +0200
> Mattias Rönnblom <hofors@lysator.liu.se> wrote:
> 
>> On 2024-08-09 17:03, Stephen Hemminger wrote:
>>> On Fri, 9 Aug 2024 11:04:36 +0200
>>> Mattias Rönnblom <mattias.ronnblom@ericsson.com> wrote:
>>>    
>>>> -uint32_t val32;
>>>> -uint64_t val64;
>>>> +#define GEN_TEST_BIT_ACCESS(test_name, set_fun, clear_fun, assign_fun,	\
>>>> +			    flip_fun, test_fun, size)			\
>>>> +	static int							\
>>>> +	test_name(void)							\
>>>> +	{								\
>>>> +		uint ## size ## _t reference = (uint ## size ## _t)rte_rand(); \
>>>> +		unsigned int bit_nr;					\
>>>> +		uint ## size ## _t word = (uint ## size ## _t)rte_rand(); \
>>>> +									\
>>>> +		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
>>>> +			bool reference_bit = (reference >> bit_nr) & 1;	\
>>>> +			bool assign = rte_rand() & 1;			\
>>>> +			if (assign)					\
>>>> +				assign_fun(&word, bit_nr, reference_bit); \
>>>> +			else {						\
>>>> +				if (reference_bit)			\
>>>> +					set_fun(&word, bit_nr);		\
>>>> +				else					\
>>>> +					clear_fun(&word, bit_nr);	\
>>>> +									\
>>>> +			}						\
>>>> +			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
>>>> +				    "Bit %d had unexpected value", bit_nr); \
>>>> +			flip_fun(&word, bit_nr);			\
>>>> +			TEST_ASSERT(test_fun(&word, bit_nr) != reference_bit, \
>>>> +				    "Bit %d had unflipped value", bit_nr); \
>>>> +			flip_fun(&word, bit_nr);			\
>>>> +									\
>>>> +			const uint ## size ## _t *const_ptr = &word;	\
>>>> +			TEST_ASSERT(test_fun(const_ptr, bit_nr) ==	\
>>>> +				    reference_bit,			\
>>>> +				    "Bit %d had unexpected value", bit_nr); \
>>>> +		}							\
>>>> +									\
>>>> +		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
>>>> +			bool reference_bit = (reference >> bit_nr) & 1;	\
>>>> +			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
>>>> +				    "Bit %d had unexpected value", bit_nr); \
>>>> +		}							\
>>>> +									\
>>>> +		TEST_ASSERT(reference == word, "Word had unexpected value"); \
>>>> +									\
>>>> +		return TEST_SUCCESS;					\
>>>> +	}
>>>> +
>>>> +GEN_TEST_BIT_ACCESS(test_bit_access32, rte_bit_set, rte_bit_clear,
>>>> +		    rte_bit_assign, rte_bit_flip, rte_bit_test, 32)
>>>> +
>>>> +GEN_TEST_BIT_ACCESS(test_bit_access64, rte_bit_set, rte_bit_clear,
>>>> +		    rte_bit_assign, rte_bit_flip, rte_bit_test, 64)
>>>
>>> Having large macro like this for two cases adds complexity without
>>> additional clarity. Just duplicate the code please.
>>
>> GEN_TEST_BIT_ACCESS is being used by six more test cases in later
>> patches in the series.
> 
> Would it be possible to make it a function and pass function pointers with
> Generic?

I'm not sure exactly what you are suggesting here, but a function can't 
do the job of GEN_TEST_BIT_ACCESS. You can't pass macros as parameters 
to functions, and also the signatures of the _Generic-macros-under-test 
(e.g., set_fun) various across different test cases.

I agree with what underlies your suggestion - prefer functions over 
macros when functions can do the job (reasonably well).
diff mbox series

Patch

diff --git a/app/test/test_bitops.c b/app/test/test_bitops.c
index 0d4ccfb468..322f58c066 100644
--- a/app/test/test_bitops.c
+++ b/app/test/test_bitops.c
@@ -1,13 +1,68 @@ 
 /* SPDX-License-Identifier: BSD-3-Clause
  * Copyright(c) 2019 Arm Limited
+ * Copyright(c) 2024 Ericsson AB
  */
 
+#include <stdbool.h>
+
 #include <rte_launch.h>
 #include <rte_bitops.h>
+#include <rte_random.h>
 #include "test.h"
 
-uint32_t val32;
-uint64_t val64;
+#define GEN_TEST_BIT_ACCESS(test_name, set_fun, clear_fun, assign_fun,	\
+			    flip_fun, test_fun, size)			\
+	static int							\
+	test_name(void)							\
+	{								\
+		uint ## size ## _t reference = (uint ## size ## _t)rte_rand(); \
+		unsigned int bit_nr;					\
+		uint ## size ## _t word = (uint ## size ## _t)rte_rand(); \
+									\
+		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
+			bool reference_bit = (reference >> bit_nr) & 1;	\
+			bool assign = rte_rand() & 1;			\
+			if (assign)					\
+				assign_fun(&word, bit_nr, reference_bit); \
+			else {						\
+				if (reference_bit)			\
+					set_fun(&word, bit_nr);		\
+				else					\
+					clear_fun(&word, bit_nr);	\
+									\
+			}						\
+			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
+				    "Bit %d had unexpected value", bit_nr); \
+			flip_fun(&word, bit_nr);			\
+			TEST_ASSERT(test_fun(&word, bit_nr) != reference_bit, \
+				    "Bit %d had unflipped value", bit_nr); \
+			flip_fun(&word, bit_nr);			\
+									\
+			const uint ## size ## _t *const_ptr = &word;	\
+			TEST_ASSERT(test_fun(const_ptr, bit_nr) ==	\
+				    reference_bit,			\
+				    "Bit %d had unexpected value", bit_nr); \
+		}							\
+									\
+		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
+			bool reference_bit = (reference >> bit_nr) & 1;	\
+			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
+				    "Bit %d had unexpected value", bit_nr); \
+		}							\
+									\
+		TEST_ASSERT(reference == word, "Word had unexpected value"); \
+									\
+		return TEST_SUCCESS;					\
+	}
+
+GEN_TEST_BIT_ACCESS(test_bit_access32, rte_bit_set, rte_bit_clear,
+		    rte_bit_assign, rte_bit_flip, rte_bit_test, 32)
+
+GEN_TEST_BIT_ACCESS(test_bit_access64, rte_bit_set, rte_bit_clear,
+		    rte_bit_assign, rte_bit_flip, rte_bit_test, 64)
+
+static uint32_t val32;
+static uint64_t val64;
 
 #define MAX_BITS_32 32
 #define MAX_BITS_64 64
@@ -117,22 +172,22 @@  test_bit_relaxed_test_set_clear(void)
 	return TEST_SUCCESS;
 }
 
+static struct unit_test_suite test_suite = {
+	.suite_name = "Bitops test suite",
+	.unit_test_cases = {
+		TEST_CASE(test_bit_access32),
+		TEST_CASE(test_bit_access64),
+		TEST_CASE(test_bit_relaxed_set),
+		TEST_CASE(test_bit_relaxed_clear),
+		TEST_CASE(test_bit_relaxed_test_set_clear),
+		TEST_CASES_END()
+	}
+};
+
 static int
 test_bitops(void)
 {
-	val32 = 0;
-	val64 = 0;
-
-	if (test_bit_relaxed_set() < 0)
-		return TEST_FAILED;
-
-	if (test_bit_relaxed_clear() < 0)
-		return TEST_FAILED;
-
-	if (test_bit_relaxed_test_set_clear() < 0)
-		return TEST_FAILED;
-
-	return TEST_SUCCESS;
+	return unit_test_suite_runner(&test_suite);
 }
 
 REGISTER_FAST_TEST(bitops_autotest, true, true, test_bitops);