[2/5] app/test-compress-perf: use portable macro for weak linking

Message ID 1735009552-31906-3-git-send-email-andremue@linux.microsoft.com (mailing list archive)
State Rejected
Delegated to: David Marchand
Headers
Series use portable macro for weak linking |

Checks

Context Check Description
ci/checkpatch success coding style OK

Commit Message

Andre Muezerie Dec. 24, 2024, 3:05 a.m. UTC
MSVC uses pragmas to indicate weak linking, so the old __rte_weak
attribute needs to made into a macro so that the same syntax can
be used for MSVC and other compilers like gcc.

This patch replaces __rte_weak with macro RTE_WEAK.

Signed-off-by: Andre Muezerie <andremue@linux.microsoft.com>
---
 app/test-compress-perf/main.c | 36 +++++++++++++++++------------------
 1 file changed, 18 insertions(+), 18 deletions(-)
  

Patch

diff --git a/app/test-compress-perf/main.c b/app/test-compress-perf/main.c
index fa366123ed..01742a39ee 100644
--- a/app/test-compress-perf/main.c
+++ b/app/test-compress-perf/main.c
@@ -522,8 +522,8 @@  main(int argc, char **argv)
 	return ret;
 }
 
-__rte_weak void *
-cperf_cyclecount_test_constructor(uint8_t dev_id __rte_unused,
+void *
+RTE_WEAK(cperf_cyclecount_test_constructor)(uint8_t dev_id __rte_unused,
 				 uint16_t qp_id __rte_unused,
 				 struct comp_test_data *options __rte_unused)
 {
@@ -531,20 +531,20 @@  cperf_cyclecount_test_constructor(uint8_t dev_id __rte_unused,
 	return NULL;
 }
 
-__rte_weak void
-cperf_cyclecount_test_destructor(void *arg __rte_unused)
+void
+RTE_WEAK(cperf_cyclecount_test_destructor)(void *arg __rte_unused)
 {
 	RTE_LOG(INFO, USER1, "Something wrong happened!!!\n");
 }
 
-__rte_weak int
-cperf_cyclecount_test_runner(void *test_ctx __rte_unused)
+int
+RTE_WEAK(cperf_cyclecount_test_runner)(void *test_ctx __rte_unused)
 {
 	return 0;
 }
 
-__rte_weak void *
-cperf_throughput_test_constructor(uint8_t dev_id __rte_unused,
+void *
+RTE_WEAK(cperf_throughput_test_constructor)(uint8_t dev_id __rte_unused,
 				 uint16_t qp_id __rte_unused,
 				 struct comp_test_data *options __rte_unused)
 {
@@ -552,19 +552,19 @@  cperf_throughput_test_constructor(uint8_t dev_id __rte_unused,
 	return NULL;
 }
 
-__rte_weak void
-cperf_throughput_test_destructor(void *arg __rte_unused)
+void
+RTE_WEAK(cperf_throughput_test_destructor)(void *arg __rte_unused)
 {
 
 }
 
-__rte_weak int
-cperf_throughput_test_runner(void *test_ctx __rte_unused)
+int
+RTE_WEAK(cperf_throughput_test_runner)(void *test_ctx __rte_unused)
 {
 	return 0;
 }
-__rte_weak void *
-cperf_verify_test_constructor(uint8_t dev_id __rte_unused,
+void *
+RTE_WEAK(cperf_verify_test_constructor)(uint8_t dev_id __rte_unused,
 				 uint16_t qp_id __rte_unused,
 				 struct comp_test_data *options __rte_unused)
 {
@@ -572,14 +572,14 @@  cperf_verify_test_constructor(uint8_t dev_id __rte_unused,
 	return NULL;
 }
 
-__rte_weak void
-cperf_verify_test_destructor(void *arg __rte_unused)
+void
+RTE_WEAK(cperf_verify_test_destructor)(void *arg __rte_unused)
 {
 
 }
 
-__rte_weak int
-cperf_verify_test_runner(void *test_ctx __rte_unused)
+int
+RTE_WEAK(cperf_verify_test_runner)(void *test_ctx __rte_unused)
 {
 	return 0;
 }