[2/5] app/test-compress-perf: use portable macro for weak linking
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Commit Message
MSVC uses pragmas to indicate weak linking, so the old __rte_weak
attribute needs to made into a macro so that the same syntax can
be used for MSVC and other compilers like gcc.
This patch replaces __rte_weak with macro RTE_WEAK.
Signed-off-by: Andre Muezerie <andremue@linux.microsoft.com>
---
app/test-compress-perf/main.c | 36 +++++++++++++++++------------------
1 file changed, 18 insertions(+), 18 deletions(-)
@@ -522,8 +522,8 @@ main(int argc, char **argv)
return ret;
}
-__rte_weak void *
-cperf_cyclecount_test_constructor(uint8_t dev_id __rte_unused,
+void *
+RTE_WEAK(cperf_cyclecount_test_constructor)(uint8_t dev_id __rte_unused,
uint16_t qp_id __rte_unused,
struct comp_test_data *options __rte_unused)
{
@@ -531,20 +531,20 @@ cperf_cyclecount_test_constructor(uint8_t dev_id __rte_unused,
return NULL;
}
-__rte_weak void
-cperf_cyclecount_test_destructor(void *arg __rte_unused)
+void
+RTE_WEAK(cperf_cyclecount_test_destructor)(void *arg __rte_unused)
{
RTE_LOG(INFO, USER1, "Something wrong happened!!!\n");
}
-__rte_weak int
-cperf_cyclecount_test_runner(void *test_ctx __rte_unused)
+int
+RTE_WEAK(cperf_cyclecount_test_runner)(void *test_ctx __rte_unused)
{
return 0;
}
-__rte_weak void *
-cperf_throughput_test_constructor(uint8_t dev_id __rte_unused,
+void *
+RTE_WEAK(cperf_throughput_test_constructor)(uint8_t dev_id __rte_unused,
uint16_t qp_id __rte_unused,
struct comp_test_data *options __rte_unused)
{
@@ -552,19 +552,19 @@ cperf_throughput_test_constructor(uint8_t dev_id __rte_unused,
return NULL;
}
-__rte_weak void
-cperf_throughput_test_destructor(void *arg __rte_unused)
+void
+RTE_WEAK(cperf_throughput_test_destructor)(void *arg __rte_unused)
{
}
-__rte_weak int
-cperf_throughput_test_runner(void *test_ctx __rte_unused)
+int
+RTE_WEAK(cperf_throughput_test_runner)(void *test_ctx __rte_unused)
{
return 0;
}
-__rte_weak void *
-cperf_verify_test_constructor(uint8_t dev_id __rte_unused,
+void *
+RTE_WEAK(cperf_verify_test_constructor)(uint8_t dev_id __rte_unused,
uint16_t qp_id __rte_unused,
struct comp_test_data *options __rte_unused)
{
@@ -572,14 +572,14 @@ cperf_verify_test_constructor(uint8_t dev_id __rte_unused,
return NULL;
}
-__rte_weak void
-cperf_verify_test_destructor(void *arg __rte_unused)
+void
+RTE_WEAK(cperf_verify_test_destructor)(void *arg __rte_unused)
{
}
-__rte_weak int
-cperf_verify_test_runner(void *test_ctx __rte_unused)
+int
+RTE_WEAK(cperf_verify_test_runner)(void *test_ctx __rte_unused)
{
return 0;
}