| Message ID | 20210115073243.7025-4-ndabilpuram@marvell.com (mailing list archive) |
|---|---|
| State | New |
| Delegated to: | David Marchand |
| Headers | show |
| Series | fix issue with partial DMA unmap | expand |
| Context | Check | Description |
|---|---|---|
| ci/iol-testing | warning | Testing issues |
| ci/iol-abi-testing | success | Testing PASS |
| ci/iol-testing | warning | Testing issues |
| ci/iol-abi-testing | success | Testing PASS |
| ci/iol-mellanox-Performance | success | Performance Testing PASS |
| ci/iol-mellanox-Performance | success | Performance Testing PASS |
| ci/iol-mellanox-Functional | success | Functional Testing PASS |
| ci/iol-mellanox-Functional | success | Functional Testing PASS |
| ci/iol-intel-Performance | success | Performance Testing PASS |
| ci/iol-intel-Functional | success | Functional Testing PASS |
| ci/iol-broadcom-Functional | success | Functional Testing PASS |
| ci/iol-intel-Performance | success | Performance Testing PASS |
| ci/iol-intel-Functional | success | Functional Testing PASS |
| ci/iol-broadcom-Functional | success | Functional Testing PASS |
| ci/intel-Testing | success | Testing PASS |
| ci/Intel-compilation | success | Compilation OK |
| ci/checkpatch | warning | coding style issues |
On 15-Jan-21 7:32 AM, Nithin Dabilpuram wrote: > Currently external memory test uses 4K page size. > VFIO DMA mapping works only with system page granularity. > > Earlier it was working because all the contiguous mappings > were coalesced and mapped in one-go which ended up becoming > a lot bigger page. Now that VFIO DMA mappings both in IOVA as VA > and IOVA as PA mode, are being done at memseg list granularity, > we need to use system page size. > > Fixes: b270daa43b3d ("test: support external memory") > Cc: anatoly.burakov@intel.com > Cc: stable@dpdk.org > > Signed-off-by: Nithin Dabilpuram <ndabilpuram@marvell.com> > --- Acked-by: Anatoly Burakov <anatoly.burakov@intel.com>
diff --git a/app/test/test_external_mem.c b/app/test/test_external_mem.c index 7eb81f6..5edf88b 100644 --- a/app/test/test_external_mem.c +++ b/app/test/test_external_mem.c @@ -13,6 +13,7 @@ #include <rte_common.h> #include <rte_debug.h> #include <rte_eal.h> +#include <rte_eal_paging.h> #include <rte_errno.h> #include <rte_malloc.h> #include <rte_ring.h> @@ -532,8 +533,8 @@ test_extmem_basic(void *addr, size_t len, size_t pgsz, rte_iova_t *iova, static int test_external_mem(void) { + size_t pgsz = rte_mem_page_size(); size_t len = EXTERNAL_MEM_SZ; - size_t pgsz = RTE_PGSIZE_4K; rte_iova_t iova[len / pgsz]; void *addr; int ret, n_pages;
Currently external memory test uses 4K page size. VFIO DMA mapping works only with system page granularity. Earlier it was working because all the contiguous mappings were coalesced and mapped in one-go which ended up becoming a lot bigger page. Now that VFIO DMA mappings both in IOVA as VA and IOVA as PA mode, are being done at memseg list granularity, we need to use system page size. Fixes: b270daa43b3d ("test: support external memory") Cc: anatoly.burakov@intel.com Cc: stable@dpdk.org Signed-off-by: Nithin Dabilpuram <ndabilpuram@marvell.com> --- app/test/test_external_mem.c | 3 ++- 1 file changed, 2 insertions(+), 1 deletion(-)