diff mbox series

[v8,3/3] test: change external memory test to use system page sz

Message ID 20210115073243.7025-4-ndabilpuram@marvell.com (mailing list archive)
State Accepted
Delegated to: David Marchand
Headers show
Series fix issue with partial DMA unmap | expand

Checks

Context Check Description
ci/iol-testing warning Testing issues
ci/iol-abi-testing success Testing PASS
ci/iol-mellanox-Performance success Performance Testing PASS
ci/iol-mellanox-Functional success Functional Testing PASS
ci/iol-intel-Performance success Performance Testing PASS
ci/iol-intel-Functional success Functional Testing PASS
ci/iol-broadcom-Functional success Functional Testing PASS
ci/intel-Testing success Testing PASS
ci/Intel-compilation success Compilation OK
ci/checkpatch warning coding style issues

Commit Message

Nithin Dabilpuram Jan. 15, 2021, 7:32 a.m. UTC
Currently external memory test uses 4K page size.
VFIO DMA mapping works only with system page granularity.

Earlier it was working because all the contiguous mappings
were coalesced and mapped in one-go which ended up becoming
a lot bigger page. Now that VFIO DMA mappings both in IOVA as VA
and IOVA as PA mode, are being done at memseg list granularity,
we need to use system page size.

Fixes: b270daa43b3d ("test: support external memory")
Cc: anatoly.burakov@intel.com
Cc: stable@dpdk.org

Signed-off-by: Nithin Dabilpuram <ndabilpuram@marvell.com>
---
 app/test/test_external_mem.c | 3 ++-
 1 file changed, 2 insertions(+), 1 deletion(-)

Comments

Anatoly Burakov Feb. 11, 2021, 11:21 a.m. UTC | #1
On 15-Jan-21 7:32 AM, Nithin Dabilpuram wrote:
> Currently external memory test uses 4K page size.
> VFIO DMA mapping works only with system page granularity.
> 
> Earlier it was working because all the contiguous mappings
> were coalesced and mapped in one-go which ended up becoming
> a lot bigger page. Now that VFIO DMA mappings both in IOVA as VA
> and IOVA as PA mode, are being done at memseg list granularity,
> we need to use system page size.
> 
> Fixes: b270daa43b3d ("test: support external memory")
> Cc: anatoly.burakov@intel.com
> Cc: stable@dpdk.org
> 
> Signed-off-by: Nithin Dabilpuram <ndabilpuram@marvell.com>
> ---

Acked-by: Anatoly Burakov <anatoly.burakov@intel.com>
diff mbox series

Patch

diff --git a/app/test/test_external_mem.c b/app/test/test_external_mem.c
index 7eb81f6..5edf88b 100644
--- a/app/test/test_external_mem.c
+++ b/app/test/test_external_mem.c
@@ -13,6 +13,7 @@ 
 #include <rte_common.h>
 #include <rte_debug.h>
 #include <rte_eal.h>
+#include <rte_eal_paging.h>
 #include <rte_errno.h>
 #include <rte_malloc.h>
 #include <rte_ring.h>
@@ -532,8 +533,8 @@  test_extmem_basic(void *addr, size_t len, size_t pgsz, rte_iova_t *iova,
 static int
 test_external_mem(void)
 {
+	size_t pgsz = rte_mem_page_size();
 	size_t len = EXTERNAL_MEM_SZ;
-	size_t pgsz = RTE_PGSIZE_4K;
 	rte_iova_t iova[len / pgsz];
 	void *addr;
 	int ret, n_pages;