test: reduce test time for hash multiwriter ut
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Commit Message
Reduced test duration for hash_multiwriter_autotest.
Number of entries and total insertions are reduced
such that the duration is less than 10 seconds.
Signed-off-by: Naga Suresh Somarowthu <naga.sureshx.somarowthu@intel.com>
---
test/test/test_hash_multiwriter.c | 4 ++--
1 file changed, 2 insertions(+), 2 deletions(-)
Comments
> -----Original Message-----
> From: dev [mailto:dev-bounces@dpdk.org] On Behalf Of Naga Suresh
> Somarowthu
> Sent: Thursday, September 27, 2018 7:39 AM
> To: dev@dpdk.org
> Cc: Richardson, Bruce <bruce.richardson@intel.com>; De Lara Guarch, Pablo
> <pablo.de.lara.guarch@intel.com>; Pattan, Reshma
> <reshma.pattan@intel.com>; Somarowthu, Naga SureshX
> <naga.sureshx.somarowthu@intel.com>
> Subject: [dpdk-dev] [PATCH] test: reduce test time for hash multiwriter ut
>
> Reduced test duration for hash_multiwriter_autotest.
> Number of entries and total insertions are reduced such that the duration is
> less than 10 seconds.
>
> Signed-off-by: Naga Suresh Somarowthu
> <naga.sureshx.somarowthu@intel.com>
> ---
Acked-by: Herakliusz Lipiec <herakliusz.lipiec@intel.com>
@@ -38,8 +38,8 @@ struct {
struct rte_hash *h;
} tbl_multiwriter_test_params;
-const uint32_t nb_entries = 16*1024*1024;
-const uint32_t nb_total_tsx_insertion = 15*1024*1024;
+const uint32_t nb_entries = 5*1024*1024;
+const uint32_t nb_total_tsx_insertion = 4*1024*1024;
uint32_t rounded_nb_total_tsx_insertion;
static rte_atomic64_t gcycles;